Archives
Volume 31 Issue 4 October-December 2024
| S.No | Article Details | Page No |
|---|---|---|
| 1 |
POWER DROOP REDUCTION IN SEQUENTIAL CIRCUIT SPEED TESTING VIA SCAN - BASED MBIST WITH LOC - ENABLED TEST VECTOR OPTIMIZATION
Author(s): Dr.I.Selvamani, Basetti Shri Vaishnavi DOI : https://appliedlasertechnology.2024.v31.i04.pp01-07 |
1-7 |
